Planar thin film YBa2Cu3O7-δ Josephson junctions via nanolithography and ion damage

被引:39
作者
Katz, AS
Sun, AG
Woods, SI
Dynes, RC
机构
[1] Univ Calif San Diego, La Jolla, CA 92093 USA
[2] TRW Co Inc, Elect Syst & Technol Div, Redondo Beach, CA 90278 USA
关键词
D O I
10.1063/1.121255
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have developed a process to fabricate planar high-T-c Josephson junctions using nanolithography and a 200 keV ion implanter. Conduction occurs in the ab plane and is interface free. We can systematically tune devices to operate at temperatures between 1 K and the T-c of the undamaged superconducting material by varying the length of the weak link and by changing the amount of ion damage. All of the devices showed clear de and ac Josephson effects. Measurement of R(T) and I-c(T) of the weak Links revealed trends which were consistent with a proximity effect. (C) 1998 American Institute of Physics.
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页码:2032 / 2034
页数:3
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