Anisotropic dielectric properties in epitaxial Bi3.25La0.75Ti3O12 thin films along different crystal directions

被引：15

作者：

Lee, JS ^{[1
]}

Kang, BS ^{[1
]}

Lin, Y ^{[1
]}

Li, Y ^{[1
]}

Jia, QX ^{[1
]}

机构：

[1] Los Alamos Natl Lab, Div Mat Sci & Technol, Los Alamos, NM 87545 USA

来源：

APPLIED PHYSICS LETTERS | 2004年 / 85卷 / 13期

关键词：

D O I：

10.1063/1.1797536

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Epitaxial (001)-oriented Bi3.25La0.75Ti3O12 (BLT) thin films were grown by pulsed-laser deposition on (001) LaAlO3 single-crystal substrates. The dielectric properties of the BLT films are highly anisotropic along different crystal directions. The dielectric constants are 358 and 160 along [100] and [1(1) over bar 0], respectively. Dielectric nonlinearity is also detected along these crystal directions. On the other hand, a much smaller dielectric constant and no detectable dielectric nonlinearity in a field range of 0-200 kV/cm are observed for a film along [001] where c-axis oriented SrRuO3 is used as the bottom electrode. (C) American Institute of Physics.

引用

页码：2586 / 2588

页数：3

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