Dynamics of resonance phenomenon and negative capacitances in the dielectric response of materials

被引:7
作者
M'Peko, JC [1 ]
机构
[1] Univ Havana, Fac Phys, Dept Mat Sci, Vedado 10400, C Habana, Cuba
关键词
D O I
10.1063/1.127102
中图分类号
O59 [应用物理学];
学科分类号
摘要
Thermoelectric characterization performed in this work on BaFe12O19 and BaTiO3 at 1 kHz involved anomalous negative capacitances over higher temperatures. By using alternating-current analysis techniques, we ratify our previous observations on their association with an inductive component leading to a resonance-type phenomenon. The dynamics of this latter, mostly expected to act rather over higher frequencies (> 10(6) Hz), is carefully examined by using a simple but consistent model. Its large stretching to lower frequencies is found to be caused by the inner dynamics of the material dielectric response when becoming governed, over higher temperatures, by the material-electrode interface properties. (C) 2000 American Institute of Physics. [S0003-6951(00)04430-2].
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页码:735 / 737
页数:3
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