Spectroscopic study of the surface oxidation of a thin epitaxial Co layer

被引：2

作者：

Mamy, R ^{[1
]}

机构：

[1] Inst Natl Sci Appl, SNCMP, CNRS, Lab Phys Mat Condensee Toulouse,Dept Phys, F-31077 Toulouse 04, France

来源：

APPLIED SURFACE SCIENCE | 2000年 / 158卷 / 3-4期

关键词：

thin films growth; surface oxidation; photoemission spectroscopy; scanning probe microscopy;

D O I：

10.1016/S0169-4332(00)00036-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We followed the surface oxidation of a 7-nm Co layer epitaxied on sapphire as a function of the oxygen coverage. Ultra-violet photoemission spectroscopy, atomic force microscopy and scanning tunneling microscopy were used to determine the thickness, surface roughness and electronic gap of the Co oxide. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：353 / 356

页数：4

共 6 条

[1] X-RAY PHOTOEMISSION STUDY OF INTERACTION OF OXYGEN AND AIR WITH CLEAN COBALT SURFACES [J].