Microcrystalline silicon from very high frequency plasma deposition and hot-wire CVD for 'micromorph' tandem solar cells

被引:5
作者
Brummack, H [1 ]
Bruggemann, R [1 ]
Wanka, HN [1 ]
Hierzenberger, A [1 ]
Schubert, MB [1 ]
机构
[1] Univ Stuttgart, Inst Phys Elekt, D-70569 Stuttgart, Germany
来源
CONFERENCE RECORD OF THE TWENTY SIXTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 1997 | 1997年
关键词
D O I
10.1109/PVSC.1997.654180
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
We have grown microcrystalline silicon from a glow discharge at very high frequencies of 55 MHz and 170 MHz with high hydrogen dilution, and also, at more than 10 times higher growth rates, similar films by hot-wire chemical vapor deposition. Both kinds of materials have extensively been characterized and compared in terms of structural, optical and electronic properties, which greatly improve by deposition in a multi-instead of a single-chamber system. Incorporation of these different materials into pin solar cells results in open circuit voltages of about 400 mV as long as the doped layers are microcrystalline and rise to more than 870 mV if amorphous p-and n-layers are used. Quantum efficiencies and fill factors are still poor but leave room for further improvement, as clearly demonstrated by a remarkable reverse bias quantum efficiency gain.
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页码:679 / 682
页数:4
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