Effect of tartrate on the morphological characteristics of the copper-tin electrodeposits from a noncyanide acid bath

被引:38
作者
Carlos, IA
Souza, CAC
Pallone, EMJA
Francisco, RHP
Cardoso, V
Lima-Neto, BS
机构
[1] Univ Fed Sao Carlos, Dept Quim, BR-13565905 Sao Carlos, SP, Brazil
[2] Univ Fed Sao Carlos, Dept Mat Engn, BR-13560 Sao Carlos, SP, Brazil
[3] USP, Inst Quim Sao Carlos, Sao Carlos, SP, Brazil
基金
巴西圣保罗研究基金会;
关键词
copper-tin alloys; noncyanide bath; platinum electroplating; tartrate as additive;
D O I
10.1023/A:1004047110057
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Copper and tin were electrodeposited on platinum substrates from a 1.0 M sulphuric acid plating bath in the presence and absence of tartrate. Voltammetric curves indicated two deposition processes, at -0.310 and -0.640 V, which do not shift upon addition of tartrate to the plating bath. The presence of tartrate decreased the current density in the region of the more cathodic process. The metals were electrodeposited at both deposition potentials and the deposits have the same proportions of copper and tin either with or without tartrate in the plating bath, as observed by AAS. X-ray spectra suggested that a mixture of Cu and eta-Cu6Sn5 alloy was deposited at the less cathodic potential. SEM analysis showed that tartrate affects the morphology of the films.
引用
收藏
页码:987 / 994
页数:8
相关论文
共 20 条
[1]  
ABDELREHIM SS, 1984, J APPL ELECTROCHEM, V24, P350
[2]  
ALLEN BJ, 1980, ELECTROCHEMICAL METH
[3]   ROLE OF TARTARIC ACID AND TARTRATES IN INHIBITION OF DENDRITIC GROWTH OF SILVER ELECTRODEPOSITED FROM AQUEOUS NITRATE SOLUTION [J].
AMBLARD, J ;
FROMENT, M ;
GEORGOULIS, C ;
PAPANASTASIOU, G .
SURFACE TECHNOLOGY, 1978, 6 (06) :409-423
[4]  
BRENNER A, 1963, PRINCIPLES PRACTICE, V1
[5]   SOME NEW FORMULAS APPLICABLE TO ELECTROCHEMICAL NUCLEATION-GROWTH-COLLISION [J].
FLETCHER, S .
ELECTROCHIMICA ACTA, 1983, 28 (07) :917-923
[6]  
Hansen M., 1958, CONSTITUTION BINARY, DOI DOI 10.1149/1.2428700
[7]  
*JOINT COMM POWD D, 1994, INT CTR DIFFRACTION
[8]  
KORTLY S, 1985, HDB CHEM EQUILIBRIA
[10]   IN-SITU SCANNING ELECTRON-MICROSCOPE COMPARISON STUDIES ON ELECTROMIGRATION OF CU AND CU(SN) ALLOYS FOR ADVANCED CHIP INTERCONNECTS [J].
LEE, KL ;
HU, CK ;
TU, KN .
JOURNAL OF APPLIED PHYSICS, 1995, 78 (07) :4428-4437