Dynamic digital integrated circuit testing using oscillation-test method

被引：14

作者：

Arabi, K

Ihs, H

Dufaza, C

Kaminska, B

机构：

[1] Opmaxx Inc, Beaverton, OR 97008 USA

[2] LIRMM, F-34392 Montpellier, France

来源：

ELECTRONICS LETTERS | 1998年 / 34卷 / 08期

关键词：

D O I：

10.1049/el:19980529

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new technique to deal with simultaneous testing of delay and stuck-at faults in digital integrated circuits is proposed. It consists of sensitising a path in the digital circuit under test and then incorporating it in a ring oscillator to test for delay and stuck-at faults in the path. This procedure should be exercised for all, or at least critical, paths in the circuit. This test technique can be used along with scan techniques or implemented as a complete built-in self-test solution.

引用

页码：762 / 764

页数：3

共 5 条

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