Noise imaging in stroboscopic ultrafast microscopy

被引：13

作者：

Freeman, MR ^{[1
]}

Hunt, RW ^{[1
]}

Steeves, GM ^{[1
]}

机构：

[1] Univ Alberta, Dept Phys, Edmonton, AB T6G 2J1, Canada

来源：

APPLIED PHYSICS LETTERS | 2000年 / 77卷 / 05期

关键词：

D O I：

10.1063/1.127096

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We describe a method for studying the presence of stochastic sample behavior stroboscopically averaged time-resolved imaging experiments. The technique is based within continuous noise analysis concurrent with signal acquisition. An example is presented in which details of random magnetic switching are exposed in a time-resolved scanning Kerr microscopy measurement. (C) 2000 American Institute of Physics. [S0003-6951(00)01331-0].

引用

页码：717 / 719

页数：3

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