Chemical vapor deposition of fluoroalkylsilane monolayer films for adhesion control in microelectromechanical systems

被引:122
作者
Mayer, TM [1 ]
de Boer, MP [1 ]
Shinn, ND [1 ]
Clews, PJ [1 ]
Michalske, TA [1 ]
机构
[1] Sandia Natl Labs, Albuquerque, NM 87185 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2000年 / 18卷 / 05期
关键词
D O I
10.1116/1.1288200
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have developed a new process for applying a hydrophobic, low adhesion energy coating to microelectromechanical (MEMS) devices. Monolayer films are synthesized from tridecafluoro-1,1,2,2- tetrahydrooctyltrichlorosilane (FOTS) and water vapor in a low-pressure chemical vapor deposition process at room temperature. Film thickness is self-limiting by virtue of the inability of precursors to stick to the fluorocarbon surface of the film once it has formed. We have measured film densities of similar to3 molecules nm(2) and film thickness of similar to1 nm. Films are hydrophobic, with a water contact angle >110 degrees. We have also incorporated an in situ downstream microwave plasma cleaning process, which provides a clean, reproducible oxide surface prior to film deposition. Adhesion tests on coated and uncoated MEMS test structures demonstrate superior performance of the FOTS coatings. Cleaned, uncoated cantilever beam structures exhibit high adhesion energies in a high humidity environment. An adhesion energy of 100 mJ m(-2) is observed after exposure to >90% relative humidity. Fluoroalkylsilane coated beams exhibit negligible adhesion at low humidity and less than or equal to 20 muJ m(-2) adhesion energy at >90% relative humidity. No obvious film degradation was observed for films exposed to >90% relative humidity at room temperature for similar to 24 h. (C) 2000 American Vacuum Society. [S0734-211X(00)00705-8].
引用
收藏
页码:2433 / 2440
页数:8
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