Complex division as a common basis for calculating phase differences in electronic speckle pattern interferometry in one step

被引：18

作者：

Burke, J ^{[1
]}

Helmers, H ^{[1
]}

机构：

[1] Univ Oldenburg, FB Phys, D-26111 Oldenburg, Germany

来源：

APPLIED OPTICS | 1998年 / 37卷 / 13期

关键词：

D O I：

10.1364/AO.37.002589

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We point out that all formulas for calculating the phase map of object deformations in one step can be described by the same simple formalism of a complex division. (C) 1998 Optical Society of America.

引用

页码：2589 / 2590

页数：2

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