Deep Metric Learning Using Triplet Network

被引:1311
作者
Hoffer, Elad [1 ]
Ailon, Nir [1 ]
机构
[1] Technion Israel Inst Technol, Dept Comp Sci, IL-32000 Haifa, Israel
来源
SIMILARITY-BASED PATTERN RECOGNITION, SIMBAD 2015 | 2015年 / 9370卷
关键词
Deep learning; Metric learning; Representation learning;
D O I
10.1007/978-3-319-24261-3_7
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Deep learning has proven itself as a successful set of models for learning useful semantic representations of data. These, however, are mostly implicitly learned as part of a classification task. In this paper we propose the triplet network model, which aims to learn useful representations by distance comparisons. A similar model was defined by Wang et al. (2014), tailor made for learning a ranking for image information retrieval. Here we demonstrate using various datasets that our model learns a better representation than that of its immediate competitor, the Siamese network. We also discuss future possible usage as a framework for unsupervised learning.
引用
收藏
页码:84 / 92
页数:9
相关论文
共 25 条
[1]  
[Anonymous], 2011, BIGLEARN NIPS WORKSH
[2]  
[Anonymous], 2013, CoRR
[3]  
Bengio Yoshua, 2013, Statistical Language and Speech Processing. First International Conference, SLSP 2013. Proceedings: LNCS 7978, P1, DOI 10.1007/978-3-642-39593-2_1
[4]   Learning Deep Architectures for AI [J].
Bengio, Yoshua .
FOUNDATIONS AND TRENDS IN MACHINE LEARNING, 2009, 2 (01) :1-127
[5]  
Bromley J., 1993, International Journal of Pattern Recognition and Artificial Intelligence, V7, P669, DOI 10.1142/S0218001493000339
[6]  
Chechik G, 2010, J MACH LEARN RES, V11, P1109
[7]   Learning a similarity metric discriminatively, with application to face verification [J].
Chopra, S ;
Hadsell, R ;
LeCun, Y .
2005 IEEE COMPUTER SOCIETY CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION, VOL 1, PROCEEDINGS, 2005, :539-546
[8]  
Coates A, 2011, P 14 INT C ART INT S, P215
[9]  
Goodfellow I. J., 2013, ICML, P2356
[10]  
Hadsell R., 2006, IEEE C COMPUT VIS PA, P1735, DOI DOI 10.1109/CVPR.2006.100