Self-assembled monolayers exposed by metastable argon and metastable helium for neutral atom lithography and atomic beam imaging

被引:57
作者
Bard, A
Berggren, KK
Wilbur, JL
Gillaspy, JD
Rolston, SL
McClelland, JJ
Phillips, WD
Prentiss, M
Whitesides, GM
机构
[1] HARVARD UNIV,DEPT PHYS,CAMBRIDGE,MA 02138
[2] HARVARD UNIV,DEPT CHEM,CAMBRIDGE,MA 02138
[3] NATL INST STAND & TECHNOL,DIV ELECTRON & OPT PHYS,GAITHERSBURG,MD 20899
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1997年 / 15卷 / 05期
关键词
D O I
10.1116/1.589529
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We used a beam of noble gas atoms in a metastable excited state to expose a thin (1.5 nm) self-assembled monolayer resist applied over a gold-coated silicon wafer. We determined exposure damage as a function of dose of metastable atoms by processing the samples in a wet-chemical etch to remove the gold from unprotected regions and then measuring the reflectivity with a laser and observing the microstructure with an atomic force microscope. We found that the minimum dose required to damage the resist substantially was 1.7(3)x10(15) atoms/cm(2) for metastable helium, and 25(7)X10(15) atoms/cm(2) for metastable argon. (C) 1997 American Vacuum Society.
引用
收藏
页码:1805 / 1810
页数:6
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