Probing magnetic anisotropy effects in epitaxial CrO2 thin films

被引：53

作者：

Spinu, L ^{[1
]}

Srikanth, H

Gupta, A

Li, XW

Xiao, G

机构：

[1] Univ New Orleans, Adv Mat Res Inst, New Orleans, LA 70148 USA

[2] IBM Corp, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USA

[3] Brown Univ, Dept Phys, Providence, RI 02912 USA

[4] Hong Kong Univ Sci & Technol, Dept Phys, Kowloon, Hong Kong, Peoples R China

来源：

PHYSICAL REVIEW B | 2000年 / 62卷 / 13期

关键词：

D O I：

10.1103/PhysRevB.62.8931

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The magnetic anisotropy in ferromagnetic chromium dioxide thin films (T-c similar to 393 K) grown epitaxially on (100) TiO2 substrates, is probed using precise rf transverse susceptibility (chi(T)) measurements. Singular peaks in chi(T) ale observed that are associated with the anisotropy (+/-H-K) and switching (+/-H-s,) fields in CrO2. Theoretical calculations of chi(T) based on a simple coherent rotation model display remarkable agreement with the experimental data, indicating that these thin films behave like single-domain magnetic particles. Magnetoelastic contributions to the total anisotropy energy are needed to describe the evolution of chi(T) peaks at lower temperatures.

引用

页码：8931 / 8934

页数：4

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