Parameter estimation in equivalent circuit analysis of dielectric cure monitoring signals using genetic algorithms

被引:6
作者
Kazilas, MC [1 ]
Skordos, AA [1 ]
Partridge, IK [1 ]
机构
[1] Cranfield Univ, Sch Ind & Mfg Sci, Adv Mat Dept, Cranfield MK43 0AL, Beds, England
关键词
cure monitoring; equivalent circuit modeling; impedance; genetic algorithms; regularization;
D O I
10.1080/10682760412331313423
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This communication concerns the treatment of dielectric data obtained from experiments following the chemical hardening process (cure) in thermosetting resins. The aim is to follow, in real time, the evolution of the individual parameters of an equivalent electrical circuit that expresses the electrical behavior of a curing thermoset. The article presents a methodology for the sequential inversion of impedance spectra obtained in cure monitoring experiments. A new parameter estimation technique based on genetic algorithms is developed and tested using different objective functions. The influence of the objective functions on the modelling performance is investigated. The new technique models successfully spectra contaminated with high noise levels. The introduction of regularization in the optimization function rationalizes the effects of outliers usually detected in cure monitoring dielectric spectra. The technique was successfully applied to the analysis of a series of spectra obtained during the cure of an epoxy thermosetting resin.
引用
收藏
页码:157 / 176
页数:20
相关论文
共 38 条
[1]   Glass fibre epoxy composite sure monitoring using parallel plate dielectric analysis in comparison with thermal and mechanical testing techniques [J].
Abraham, D ;
McIlhagger, R .
COMPOSITES PART A-APPLIED SCIENCE AND MANUFACTURING, 1998, 29 (07) :811-819
[2]  
Andjelic S, 1998, J POLYM SCI POL PHYS, V36, P641, DOI 10.1002/(SICI)1099-0488(199803)36:4<641::AID-POLB10>3.3.CO
[3]  
2-6
[4]  
[Anonymous], 2001, An introduction to genetic algorithms
[5]   On the use of WLF equation to study resin curing by dielectric spectroscopy [J].
Bartolomeo, P ;
Chailan, JF ;
Vernet, JL .
POLYMER, 2001, 42 (09) :4385-4392
[6]  
Bellucci F, 1996, J POLYM SCI POL PHYS, V34, P1277, DOI 10.1002/(SICI)1099-0488(199605)34:7<1277::AID-POLB9>3.0.CO
[7]  
2-S
[8]   Variance of errors and elimination of outliers in the least squares analysis of impedance spectra [J].
Dygas, JR ;
Breiter, MW .
ELECTROCHIMICA ACTA, 1999, 44 (24) :4163-4174
[9]   Dipolar relaxations in an epoxy-amine system [J].
Eloundou, JP .
EUROPEAN POLYMER JOURNAL, 2002, 38 (03) :431-438
[10]   Changes in molecular dynamics during bulk polymerization of an epoxide-amine system as studied by dielectric relaxation spectroscopy [J].
Fournier, J ;
Williams, G ;
Duch, C ;
Aldridge, GA .
MACROMOLECULES, 1996, 29 (22) :7097-7107