A new focus measure method using moments

被引:75
作者
Zhang, Y [1 ]
Zhang, Y [1 ]
Wen, CY [1 ]
机构
[1] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore
关键词
point spread function; focus/defocus; moments;
D O I
10.1016/S0262-8856(00)00038-X
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
In this payer, we propose a new simple yet effective focus measure method. By this method, focus information can be deduced from the 2nd- or 4th-order central moments of a sequence of images. The advantage of the moment-based method over existing schemes is that it gives an explicit expression of the parameter of the Point Spread Function (PSF). After appropriate processing, we can get a curve which is independent of imaged objects and use it to express the blur property of the imaging system. Results obtained from simulation studies and a practical application demonstrate the effectiveness of the proposed method. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:959 / 965
页数:7
相关论文
共 11 条
[1]  
Boddeke F. R., 1994, Bioimaging, V2, P193, DOI 10.1002/1361-6374(199412)2:4<193::AID-BIO4>3.3.CO
[2]  
2-C
[3]   IMAGE FEATURES INVARIANT WITH RESPECT TO BLUR [J].
FLUSSER, J ;
SUK, T ;
SAIC, S .
PATTERN RECOGNITION, 1995, 28 (11) :1723-1732
[4]   Degraded image analysis: An invariant approach [J].
Flusser, J ;
Suk, T .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1998, 20 (06) :590-603
[5]  
Gaskill J.D., 1978, Linear Systems, Fourier Transforms, and Optics
[6]  
KROTKOV E, 1987, INT J COMPUT VISION, V1, P223, DOI 10.1007/BF00127822
[7]   SHAPE FROM FOCUS [J].
NAYAR, SK ;
NAKAGAWA, Y .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1994, 16 (08) :824-831
[8]   A NEW SENSE FOR DEPTH OF FIELD [J].
PENTLAND, AP .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1987, 9 (04) :523-531
[9]   FOCUSING TECHNIQUES [J].
SUBBARAO, M ;
CHOI, T ;
NIKZAD, A .
OPTICAL ENGINEERING, 1993, 32 (11) :2824-2836
[10]   Selecting the optimal focus measure for autofocusing and depth-from-focus [J].
Subbarao, M ;
Tyan, JK .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1998, 20 (08) :864-870