Generation of subquarter-micron resist structures using optical interference lithography and image reversal

被引:8
作者
Decker, JY [1 ]
Fernandez, A [1 ]
Sweeney, DW [1 ]
机构
[1] Univ Calif Lawrence Livermore Natl Lab, Livermore, CA 94551 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1997年 / 15卷 / 06期
关键词
D O I
10.1116/1.589583
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We show that by using interference lithography coupled with image reversal techniques we can generate resist structures ranging from one-dimensional gratings to two-dimensional arrays of posts and holes. These resist structures have high aspect ratios and nearly vertical sidewalls. The structure dimensions are accurately controlled by varying the exposure dose. These structures play critical roles in the generation of subwavelength structured surfaces for optical applications. (C) 1997 American Vacuum Society.
引用
收藏
页码:1949 / 1953
页数:5
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