Spin microscope based on optically detected magnetic resonance

被引：83

作者：

Chernobrod, BM ^{[1
]}

Berman, GP ^{[1
]}

机构：

[1] Los Alamos Natl Lab, Div Theoret, Los Alamos, NM 87545 USA

来源：

JOURNAL OF APPLIED PHYSICS | 2005年 / 97卷 / 01期

关键词：

D O I：

10.1063/1.1829373

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We propose a scanning magnetic microscope which has a photoluminescence nanoprobe implanted in the tip of an atomic force microscope, (AFM) scanning tunneling microscope (STM), or near-field scanning optical microscope, and exhibits optically detected magnetic resonance. The proposed spin microscope has nanoscale lateral resolution and the single spin sensitivity for AFM and STM. (C) 2005 American Institute of Physics.

引用

页数：3

共 14 条

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