X-ray-laser interaction with matter and the role of multiphoton ionization:: Free-electron-laser studies on neon and helium

被引：145

作者：

Sorokin, A. A.

Wellhoefer, M.

Bobashev, S. V.

Tiedtke, K.

Richter, M.

机构：

[1] Phys Tech Bundesanstalt, D-10587 Berlin, Germany

[2] AF Ioffe Phys Tech Inst, St Petersburg 194021, Russia

[3] Univ Hamburg, D-22761 Hamburg, Germany

[4] DESY, D-22603 Hamburg, Germany

来源：

PHYSICAL REVIEW A | 2007年 / 75卷 / 05期

关键词：

D O I：

10.1103/PhysRevA.75.051402

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

At the soft-x-ray free-electron laser FLASH in Hamburg, we have studied multiphoton ionization on neon and helium by ion mass-to-charge spectroscopy. The experiments were performed in a focused beam at 42.8 and 38.4 eV photon energy and irradiance levels up to 10(14) W/cm(2). Direct, sequential, and resonant two-, three-, and four-photon excitations were investigated by quantitative measurements as a function of the absolute photon intensity. The atomic and ionic photoionization cross sections derived indicate a clear dominance of sequential compared to direct multiphoton processes.

引用

页数：4

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