Fabrication and characterization of microlens arrays using a cantilever-based spotter

被引:33
作者
Bardinal, V.
Daran, E.
Leichle, T.
Vergnenegre, C.
Levallois, C.
Camps, T.
Conedera, V.
Doucet, J. B.
Carcenac, F.
Ottevaere, H.
Thienpont, H.
机构
[1] CNRS, LAAS, F-31077 Toulouse, France
[2] Vrije Univ Brussel, Dept Appl Phys & Photon, TONA IR, B-1050 Brussels, Belgium
来源
OPTICS EXPRESS | 2007年 / 15卷 / 11期
关键词
D O I
10.1364/OE.15.006900
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We present a quantitative study on the fabrication of microlenses using a low-cost polymer dispending technique. Our method is based on the use of a silicon micro-cantilever robotized spotter system. We first give a detailed description of the technique. In a second part, the fabricated microlenses are fully characterized by means of SEM (Scanning Electron Microscope), AFM (Atomic Force Microscopy) non contact optical profilometry and Mach-Zehnder interferometry. Diameters in the range [25-130 mu m] are obtained with an average surface roughness of 2.02nm. Curvature radii, focal lengths as well as aberrations are also measured for the first time: the fabricated microlenses present focal lengths in the range [55-181 mu m] and exhibit high optical quality only limited by diffraction behaviour with RMS aberration lower than lambda/14. (C) 2007 Optical Society of America.
引用
收藏
页码:6900 / 6907
页数:8
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