共 20 条
- [1] BORN M, 1970, PRINCIPLES OPTICS
- [5] Dragoman D., 1999, ADV OPTOELECTRONIC D
- [7] Characterization of silicon cantilevers with integrated pyramidal metal tips in atomic force microscopy [J]. DESIGN, TEST, AND MICROFABRICATION OF MEMS AND MOEMS, PTS 1 AND 2, 1999, 3680 : 994 - 1005