Microwave measurements Part I: Linear measurements

被引：27

作者：

Pirola, Marco

Teppati, Valeria

Camarchia, Vittorio

机构：

[1] Politecnico di Torino, Torino

来源：

IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE | 2007年 / 10卷 / 02期

关键词：

NETWORK ANALYZER;

D O I：

10.1109/MIM.2007.364959

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An overview is given of the most important issues related to radio frequency (RF) and microwave measurements. The scattering formalism is introduced and its effectiveness for high-frequency device characterization is explained. The principal features of two microwave instruments, the VNA (vector network analyzer) and the spectrum analyzer, are presented. Finally, the elimination of systematic errors that are of critical importance at high frequency is outlined.

引用

页码：14 / 19

页数：6

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