Low loss high dielectric permittivity of polyvinylidene fluoride and KxTiyNi1-x-yO (x=0.05, y=0.02) composites

被引：40

作者：

Bhadra, Debabrata ^{[1
]}

Biswas, A. ^{[1
]}

Sarkar, S. ^{[1
]}

Chaudhuri, B. K. ^{[1
]}

Tseng, K. F. ^{[2
]}

Yang, H. D. ^{[2
]}

机构：

[1] Indian Assoc Cultivat Sci, Dept Solid State Phys, Kolkata 700032, W Bengal, India

[2] Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 804, Taiwan

来源：

JOURNAL OF APPLIED PHYSICS | 2010年 / 107卷 / 12期

关键词：

CRITICAL-BEHAVIOR; CERAMIC-POWDER; CONSTANT; POLYMER; CONDUCTIVITY;

D O I：

10.1063/1.3437633

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Homogeneous thick film (similar to 0.10 mm) of high dielectric K0.05Ti0.02Ni0.93O; abbreviated as KTNO/polyvinylidene fluoride (PVDF) composite has been prepared by hot-molding technique. The frequency and temperature dependent dielectric behavior of this composite has been studied by varying the KTNO volume fraction (f(KTNO)). Near the percolation threshold (f(KTNO)=0.40), a large enhancement of effective dielectric permittivity (epsilon(eff)similar to 400 which is 40 times higher than that of pure PVDF) with low loss (similar to 0.20 at 1 kHz) is observed. The experimental epsilon(eff) data have been fitted with different theoretical models and found to follow percolation theory successfully. Such a high epsilon(eff) and low loss flexible dielectric material appears to be suitable for technological applications. (c) 2010 American Institute of Physics. [doi:10.1063/1.3437633]

引用

页数：7

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