Breakdown of the iron passive layer by use of the scanning electrochemical microscope

被引:79
作者
Still, JW
Wipf, DO
机构
[1] Department of Chemistry, Mississippi State University, Mississippi State
关键词
D O I
10.1149/1.1837879
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
The scanning electrochemical microscope (SECM) is used to generate localized corrosion at passivating iron surfaces by using the tip to generate Cl- ions. Use of the SECM allows the rapid establishment of a locally aggressive chemical environment at a preselected site on the iron surface. The susceptibility for passive layer breakdown and corrosion initiation was examined as a function of the time between the start of the passive layer growth and the formation of Cl- ions. The breakdown of the passive layer was found to depend strongly on the passivation potential and the site of Cl- formation on the iron surface. In addition to generating Cl- ions, the SECM tip was simultaneously used to detect large iron ion concentration fluctuations as corrosion began. Current fluctuations at the tip were observed and ascribed to precursors to the passive layer breakdown.
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页码:2657 / 2665
页数:9
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