Microstenciling: A generic technology for microscale patterning of vapor deposited materials

被引:31
作者
Graff, M [1 ]
Mohanty, SK [1 ]
Moss, E [1 ]
Frazier, AB [1 ]
机构
[1] Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA
关键词
metallization; microstenciling; microsystems; thin-film deposition;
D O I
10.1109/JMEMS.2004.838368
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this work, the fabrication of microstencils for patterning on unconventional substrates was demonstrated. Stencil feature sizes ranging from 6 to 370 mum with aspect ratios (stencil feature height : width) in the range of 0.5: 1 to 15: 1 were fabricated using ICP etching of silicon. The stenciling process was demonstrated for the deposition of metals (Ti/Au) and dielectrics (silicon dioxide) onto silicon, glass, and polymer based substrates for microfluidic system development. The results demonstrated some dependency of the deposition rate on the stencil feature size and aspect ratio. Results from adhesion studies showed excellent adhesion on all substrates with the exception of PMMA.
引用
收藏
页码:956 / 962
页数:7
相关论文
共 14 条
  • [1] Self-aligned 3D shadow mask technique for patterning deeply recessed surfaces of micro-electro-mechanical systems devices
    Brugger, J
    Andreoli, C
    Despont, M
    Drechsler, U
    Rothuizen, H
    Vettiger, P
    [J]. SENSORS AND ACTUATORS A-PHYSICAL, 1999, 76 (1-3) : 329 - 334
  • [2] DOHLER GH, 1986, APPL PHYS LETT, V49, P704, DOI 10.1063/1.97573
  • [3] Folch A, 2000, J BIOMED MATER RES, V52, P346, DOI 10.1002/1097-4636(200011)52:2<346::AID-JBM14>3.0.CO
  • [4] 2-H
  • [5] KIM GM, 2003, 12 INT C SOLID STAT
  • [6] LIANG TX, 1996, IEEE T COMPON PACKAG, V19
  • [7] MOHANTY SK, 2001, MICRO TOTAL ANAL SYS, P387
  • [8] Optimising process parameters for flip chip stencil printing using Taguchi's method
    Rajkumar, D
    Nguty, T
    Ekere, NN
    [J]. TWENTY SIXTH IEEE/CPMT INTERNATIONAL ELECTRONICS MANUFACTURING TECHNOLOGY SYMPOSIUM, PROCEEDINGS, 2000, : 382 - 388
  • [9] RAUF S, 2001, PULSED POWER PLASMA, P474
  • [10] SHIBATA T, 2002, IEEE T SEMICOND MANU, V15