Scaling of the coercive field with thickness in thin-film ferroelectrics

被引:50
作者
Chandra, P [1 ]
Dawber, M
Littlewood, PB
Scott, JF
机构
[1] Rutgers State Univ, Dept Phys, Piscataway, NJ 08855 USA
[2] Univ Cambridge, Dept Earth Sci, Symetrix Ctr Ferro, Cambridge CB2 3EQ, England
[3] Univ Cambridge, Cavendish Lab, Cambridge CB3 0HE, England
关键词
thin-film ferroelectrics; coercive field; thickness-scaling;
D O I
10.1080/00150190490891157
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Motivated by the observed thickness-scaling of the coercive field in ferroelectric films over five decades, we develop a statistical approach towards understanding the conceptual underpinnings of this behavior. Here the scaling exponent is determined by the field-dependence of a known and measured quantity, the nucleation rate per unit area. We end with a discussion of our initial assumptions and point to instances where they could no longer be applicable.
引用
收藏
页码:7 / 13
页数:7
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