Effect of ultra-clean sputtering on magnetoresistance and thermal stability of magnetoresistance in spin-valves

被引:3
作者
Hayashi, K [1 ]
Nakada, M
Kamijo, A
Fujikata, J
Yamada, K
机构
[1] NEC Corp Ltd, Funct Devices Res Labs, Fuchu, Tokyo 183, Japan
[2] NEC Corp Ltd, Fundamental Res Labs, Kawasaki, Kanagawa 216, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1998年 / 37卷 / 4A期
关键词
ultra-clean sputtering; spin-valve; base pressure; magnetoresistance; thermal stability;
D O I
10.1143/JJAP.37.L386
中图分类号
O59 [应用物理学];
学科分类号
摘要
The influence of the base pressure (8.6 x 10(-10)-1.3 x 10(-7) Torr) in the sputtering chamber just before the deposition on the magnetoresistance (MR) ratios and the thermal stability of the MR ratios in spin-valves (SVs) was studied, using purified sputtering Ar gas (impurity level less than 1 ppb). The resistivity rho in the SVs decreased and as a result, the MR ratio increased with decreasing base pressure. Also, the thermal stability of the MR ratio was improved with decreasing base pressure. The increase of grain size in the SVs fabricated under low base pressures bears a close relationship to the MR ratios and the thermal stability of the MR ratios.
引用
收藏
页码:L386 / L389
页数:4
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