Analysis of conducting rigid inclusion at the interface of two dissimilar piezoelectric materials

被引:48
作者
Deng, W [1 ]
Meguid, SA [1 ]
机构
[1] Univ Toronto, Dept Mech & Ind Engn, Engn Mech & Design Lab, Toronto, ON M5S 3G8, Canada
来源
JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME | 1998年 / 65卷 / 01期
关键词
D O I
10.1115/1.2789049
中图分类号
O3 [力学];
学科分类号
08 ; 0801 ;
摘要
This paper is concerned with the electro-elastic analysis of a conducting rigid line inclusion at the interface of two bonded piezoelectric materials. By combining the expressions for the field variables. Both the mechanical stresses and the electric displacement are shown to have at least one of the following behaviors: (i) traditional square root singularity; (ii) nonsquare root singularity and (iii) oscillatory singularity, which depend upon the electro-elastic mismatch at the interface. By using the static equilibrium conditions, the rigid rotation vector of the inclusion is determined and the extended stress singularity factors (ESSF) are evaluated.
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页码:76 / 84
页数:9
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