Dependence of ferromagnetic properties on carrier transfer at GaMnN/GaN:Mg interface

被引:30
作者
Arkun, FE
Reed, MJ
Berkman, EA
El-Masry, NA
Zavada, JM
Reed, ML
Bedair, SM
机构
[1] N Carolina State Univ, Dept Mat Sci & Engn, Raleigh, NC 27695 USA
[2] USA, Res Off, Durham, NC 27709 USA
[3] N Carolina State Univ, Dept Elect & Comp Engn, Raleigh, NC 27695 USA
关键词
Chemical vapor deposition - Fermi level - Ferromagnetic materials - Heterojunctions - Magnetic semiconductors - Secondary ion mass spectrometry - Silicon - SQUIDs;
D O I
10.1063/1.1810216
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report on the dependence of ferromagnetic properties of metalorganic chemical vapor deposition grown GaMnN films on carrier transfer across adjacent layers. We found that the magnetic properties of GaMnN, as a part of GaMnN/GaN:Mg heterostructures, depend on the thickness of both the GaMnN film and the adjacent GaN:Mg layer and on the presence of a wide band gap barrier at this interface. These results are explained based on the occupancy of the Mn energy band and how the occupancy can be altered due to carrier transfer at the GaMnN/GaN:Mg interfaces. (C) 2004 American Institute of Physics.
引用
收藏
页码:3809 / 3811
页数:3
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