Synthesis of fault-tolerant supervisor for automated manufacturing systems: A case study on photolithographic process

被引:32
作者
Cho, KH [1 ]
Lim, JT [1 ]
机构
[1] Korea Adv Inst Sci & Technol, Dept Elect Engn, Taejon 305701, South Korea
来源
IEEE TRANSACTIONS ON ROBOTICS AND AUTOMATION | 1998年 / 14卷 / 02期
关键词
discrete event dynamic systems; fault-tolerance; photolithographic process; supervisor;
D O I
10.1109/70.681255
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, a discrete event dynamic system (DEDS) approach is utilized to improve the reliability of a system from the fault-tolerance viewpoint. We propose a systematic way to classify faults and failures quantitatively and to find tolerable fault event sequences embedded in DEDS's. After this, the synthesis of a fault-tolerant supervisory control system is investigated. A case study of a photolithographic process in a semiconductor manufacturing system is provided to illustrate these techniques.
引用
收藏
页码:348 / 351
页数:4
相关论文
共 8 条
[1]  
Heymann M., 1990, IEEE Control Systems Magazine, V10, P103, DOI 10.1109/37.56284
[2]  
Jaeger R.C., 1993, INTRO MICROELECTRONI
[3]  
LIN F, 1994, J DEDS, V4, P197
[4]   REVIEW OF PARITY SPACE APPROACHES TO FAULT-DIAGNOSIS FOR AEROSPACE SYSTEMS [J].
PATTON, RJ ;
CHEN, J .
JOURNAL OF GUIDANCE CONTROL AND DYNAMICS, 1994, 17 (02) :278-285
[5]   SUPERVISORY CONTROL OF A CLASS OF DISCRETE EVENT PROCESSES [J].
RAMADGE, PJ ;
WONHAM, WM .
SIAM JOURNAL ON CONTROL AND OPTIMIZATION, 1987, 25 (01) :206-230
[6]   THE CONTROL OF DISCRETE EVENT SYSTEMS [J].
RAMADGE, PJG ;
WONHAM, WM .
PROCEEDINGS OF THE IEEE, 1989, 77 (01) :81-98
[7]   DIAGNOSABILITY OF DISCRETE-EVENT SYSTEMS [J].
SAMPATH, M ;
SENGUPTA, R ;
LAFORTUNE, S ;
SINNAMOHIDEEN, K ;
TENEKETZIS, D .
IEEE TRANSACTIONS ON AUTOMATIC CONTROL, 1995, 40 (09) :1555-1575
[8]   ON THE SUPREMAL CONTROLLABLE SUBLANGUAGE OF A GIVEN LANGUAGE [J].
WONHAM, WM ;
RAMADGE, PJ .
SIAM JOURNAL ON CONTROL AND OPTIMIZATION, 1987, 25 (03) :637-659