Effect of glass composition on the electrical properties of thick-film resistors

被引:35
作者
Adachi, K [1 ]
Kuno, H [1 ]
机构
[1] Sumitomo Met Min Co, Cent Res Lab, Chiba 2728588, Japan
关键词
D O I
10.1111/j.1151-2916.2000.tb01574.x
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Ruthenium-based thick-film resistors (TFRs) with lead borosilicate glasses of various compositions have been examined for their electrical properties. A striking increase in resistivity has been observed with lead-depleted glasses, and analysis of this increase reveals that it is derived from the critical loss of Ru ions/clusters in the glass. With high-lead-content glasses, the resistivity decreases by two orders of magnitude, in conjunction with the structural inclination of glass toward PbO . SiO2, 2PbO . SiO2, and 4PbO . B2O3, which are believed to accommodate more Ru ions/clusters. These behaviors substantiate the role of Ru ions/clusters in glass as an indispensable entity for electrical conduction in TFRs.
引用
收藏
页码:2441 / 2448
页数:8
相关论文
共 17 条
[1]  
Adachi K, 1997, J AM CERAM SOC, V80, P1055
[2]   RUTHENIUM CLUSTERS IN LEAD-BOROSILICATE GLASS IN THICK-FILM RESISTORS [J].
ADACHI, K ;
IIDA, S ;
HAYASHI, K .
JOURNAL OF MATERIALS RESEARCH, 1994, 9 (07) :1866-1878
[3]   THIN GLASS-FILM BETWEEN ULTRAFINE CONDUCTOR PARTICLES IN THICK-FILM RESISTORS [J].
CHIANG, YM ;
SILVERMAN, LA ;
FRENCH, RH ;
CANNON, RM .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1994, 77 (05) :1143-1152
[4]   THE METAL-TO-SEMICONDUCTOR TRANSITION IN TERNARY RUTHENIUM(IV) OXIDES - A STUDY BY ELECTRON-SPECTROSCOPY [J].
COX, PA ;
EGDELL, RG ;
GOODENOUGH, JB ;
HAMNETT, A ;
NAISH, CC .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1983, 16 (32) :6221-6239
[5]  
Dell'Acqua R., 1994, THICK FILM SENSORS, P85
[6]   ELECTRICAL-CONDUCTION BY PERCOLATION IN THICK-FILM RESISTORS [J].
FORLANI, F ;
PRUDENZIATI, M .
ELECTROCOMPONENT SCIENCE AND TECHNOLOGY, 1976, 3 (02) :77-83
[7]  
HILL RM, 1979, P 2 EUR S MICR GHENT, P95
[8]   Calculation of density and optical constants of a glass from its composition in weight percentage [J].
Huggins, ML ;
Sun, KH .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1943, 26 (01) :4-11
[9]   X-RAY-DIFFRACTION ANALYSIS ON THE STRUCTURE OF THE GLASSES IN THE SYSTEM PBO-SIO2 [J].
IMAOKA, M ;
HASEGAWA, H ;
YASUI, I .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1986, 85 (03) :393-412
[10]  
Inokuma T., 1987, Active and Passive Electronic Components, V12, P155, DOI 10.1155/1987/87862