A nano-indentation study of the reduced elastic modulus of Alq3 and NPB thin-film used in OLED devices

被引：24

作者：

Chiang, Chien-Jung ^{[1
]}

Bull, Steve ^{[2
]}

Winscom, Chris ^{[3
]}

Monkman, Andy ^{[1
]}

机构：

[1] Univ Durham, Dept Phys, Inst Photon Mat, Durham DH1 3LE, England

[2] Newcastle Univ, Sch Chem Engn & Adv Mat, Newcastle Upon Tyne NE1 7RU, Tyne & Wear, England

[3] Brunel Univ, Wolfson Ctr Mat Proc, Ctr Phosphor & Display Mat, Uxbridge UB8 3PH, Middx, England

来源：

ORGANIC ELECTRONICS | 2010年 / 11卷 / 03期

关键词：

OLED; Flexible OLED; Nano-indentation; Coated systems; NPB; Alq(3); HARDNESS; LOAD;

D O I：

10.1016/j.orgel.2009.11.026

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Two of the commonly-used Organic Light Emitting Diode (OLED) materials tris-(8-hydroxyquinoline) aluminum (Alq(3)) and N, N'-bis(naphthalen-1-yl)-N, N'-bis(phenyl) benzidine (NPB) are thermally evaporated as thin-films on two kinds of substrates with different hardness. By using nano-indentation techniques, the reduced elastic modulus of each of the coatings is measured. The data are carefully analysed through the standard Oliver and Pharr method, and the recently developed critical indentation depth method which takes the effect of the substrate more into account. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：450 / 455

页数：6

共 12 条

[1] Nano-indentation of coatings [J].

Bull, SJ .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2005, 38 (24) :R393-R413

[2] A critical examination of the relationship between plastic deformation zone size and Young's modulus to hardness ratio in indentation testing [J].

Chen, J. ;

Bull, S. J. .

JOURNAL OF MATERIALS RESEARCH, 2006, 21 (10) :2617-2627

[3] On the factors affecting the critical indenter penetration for measurement of coating hardness [J].

Chen, J. ;

Bull, S. J. .

VACUUM, 2009, 83 (06) :911-920

[4] Mechanical modeling of flexible OLED devices [J].

Chiang, Chien-Jung ;

Winscom, Chris ;

Bull, Steve ;

Monkman, Andy .

ORGANIC ELECTRONICS, 2009, 10 (07) :1268-1274

[5]

Crawford GP, 2005, WILEY-SID SER DISPL, P1, DOI 10.1002/0470870508.ch1

[6] The influence of indenter bluntness on the apparent contact stiffness of thin coatings [J].

Korsunsky, A. M. ;

Constantinescu, A. .

THIN SOLID FILMS, 2009, 517 (17) :4835-4844

[7] On the hardness of coated systems [J].

Korsunsky, AM ;

McGurk, MR ;

Bull, SJ ;

Page, TF .

SURFACE & COATINGS TECHNOLOGY, 1998, 99 (1-2) :171-183

[8] AN IMPROVED TECHNIQUE FOR DETERMINING HARDNESS AND ELASTIC-MODULUS USING LOAD AND DISPLACEMENT SENSING INDENTATION EXPERIMENTS [J].

OLIVER, WC ;

PHARR, GM .

JOURNAL OF MATERIALS RESEARCH, 1992, 7 (06) :1564-1583

[9] Mechanical stability of externally deformed indium-tin-oxide films on polymer substrates [J].

Park, SK ;

Han, JI ;

Moon, DG ;

Kim, WK .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2003, 42 (2A) :623-629

[10] Nanoindentation on soft film/hard substrate and hard film/soft substrate material systems with finite element analysis [J].

Pelegri, Assimina A. ;

Huang, Xiaoqln .

COMPOSITES SCIENCE AND TECHNOLOGY, 2008, 68 (01) :147-155

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