Band structure information and resonant inelastic soft X-ray scattering in broad band solids

被引：65

作者：

Eisebitt, S ^{[1
]}

Eberhardt, W ^{[1
]}

机构：

[1] Forschungszentrum, Inst Festkorperforsch, D-52425 Julich, Germany

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 2000年 / 110卷 / 1-3期

关键词：

D O I：

10.1016/S0368-2048(00)00172-9

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

We review the current status of resonant inelastic soft X-ray scattering in broad band solids. In particular, the opportunities and limitations of this technique in order to obtain band structure information are discussed and compared to the well established technique of angle resolved photoemission. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：335 / 358

页数：24

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