MBE growth and structural characterization of ZnS1-xSex thin films on ITO/glass substrates

被引：19

作者：

Shen, D ^{[1
]}

Au, SY

Han, G

Que, D

Wang, N

Sou, IK

机构：

[1] Hong Kong Univ Sci & Technol, Dept Phys, Kowloon, Hong Kong, Peoples R China

[2] Zhejiang Univ, State Key Lab Silicon Mat Sci, Hangzhou 310027, Peoples R China

来源：

JOURNAL OF MATERIALS SCIENCE LETTERS | 2003年 / 22卷 / 06期

关键词：

D O I：

10.1023/A:1022992502295

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The growth and characterization of ZnS1-xSex thin flms on indium tin oxide (ITO) glass substrates was investigated. The chemical compositions of the films were determined by using X-ray photoelectron spectroscopy (XPS). The results showed that the MBE grown polycrystalline ZnS1-xSex thin films on ITO glass substrates could achieve high structural quality.

引用

页码：483 / 487

页数：5

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