The second-order condition for the dielectric interface orthogonal to the Yee-lattice axis in the FDTD scheme

被引:53
作者
Hirono, T [1 ]
Shibata, Y
Lui, WW
Seki, S
Yoshikuni, Y
机构
[1] NTT, Photon Labs, Atsugi, Kanagawa 2430198, Japan
[2] Lightwave Microsyst, San Jose, CA 95134 USA
来源
IEEE MICROWAVE AND GUIDED WAVE LETTERS | 2000年 / 10卷 / 09期
关键词
electromagnetic fields; FDTD methods; numerical analysis; time domain analysis;
D O I
10.1109/75.867850
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The reflection coefficient at the dielectric interface orthogonal to the Yee-lattice axis in the finite-difference time-domain scheme is explicitly obtained. In the expression, the effective permittivities assigned to the nodes in the vicinity of the interface are included as parameters. The suitable effective permittivities for the accurate modeling of the interface are investigated theoretically based on the reflection coefficient. Regardless of the angular frequency, the incident angle, and the interface position relative to the lattice, second-order accuracy is achieved by the use of effective permittivies based on the weighted harmonic mean and arithmetic mean of the material permittivities, The second-order accuracy is demonstrated by numerical examples.
引用
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页码:359 / 361
页数:3
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