Characteristics of La0.8Sr0.2Co1-xCuxO3-δ film and its sensing properties for CO gas

被引：27

作者：

Chai, YL

Ray, DT

Liu, HS

Dai, CF

Chang, YH ^{[1
]}

机构：

[1] Natl Cheng Kung Univ, Dept Mat Sci & Engn, Tainan 70101, Taiwan

[2] Dahan Inst Technol, Dept Resources Engn, Hualien 971, Taiwan

[3] Natl Cheng Kung Univ, Dept Resources Engn, Tainan 70101, Taiwan

来源：

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 2000年 / 293卷 / 1-2期

关键词：

gas sensor; dipping method; perovskite phase; sensitivity;

D O I：

10.1016/S0921-5093(00)01226-0

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

La0.8Sr0.2Co1-xCuxO3-delta films prepared by using the dipping method have been shown to give a relatively high sensitivity to CO of concentration between 50 and 200 ppm for the temperature between 200 and 350 degrees C. The sensing properties of La0.8Sr0.2Co1-xCuxO3-delta films are functions of temperature and Cu content. The maximum sensitivity was obtained for films doped with x = 0.4 of Cu and operated at the temperature of 250 degrees C. The sensing mechanism is a surface reaction process, which can be thermally activated. The relationship of sensitivity to CO concentration is shown to be linear; while, the electric resistance of the films is shown to be an exponential function of CO concentration. An empirical relationship of R approximate to KCCOalpha with alpha = 0.0273 can be obtained, (C) 2000 Elsevier Science S.A. All rights reserved.

引用

页码：39 / 45

页数：7

共 17 条

[1] The influence of microstructure and deposition methods on CO gas sensing properties of La0.8Sr0.2Co1-xNixO3-δ perovskite films [J].