Characterization of thin film microstrip lines on polyimide

被引：92

作者：

Ponchak, GE ^{[1
]}

Downey, AN ^{[1
]}

机构：

[1] NASA, Lewis Res Ctr, Electron Device Technol Branch, Cleveland, OH 44135 USA

来源：

IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART B-ADVANCED PACKAGING | 1998年 / 21卷 / 02期

关键词：

microstrip; microwave; multilayer; polyimide; transmission lines;

D O I：

10.1109/96.673705

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This paper presents an in depth characterization of thin film microstrip (TFMS) fines fabricated on Dupont PI-2611 polyimide. Measured attenuation and effective dielectric constant is presented for TFMS lines with thicknesses from 2.45-7.4 mu m and line widths from 5-34.4 mu m over the frequency range of 1-110 GHz. The attenuation is separated into conductor and dielectric losses to determine the loss tangent of Dupont PI-2611 polyimide over the microwave frequency range. In addition, the measured characteristics are compared to closed form equations for alpha and epsilon(eff) from the literature. Based on the comparisons, recommendations for the best closed form design equations for TFMS are made.

引用

页码：171 / 176

页数：6

共 25 条

[1]

[Anonymous], IEEE MTT S INT MICR

[2] SMALL-SIZED MMIC AMPLIFIERS USING THIN DIELECTRIC LAYERS [J].

BANBA, S ;

OGAWA, H .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1995, 43 (03) :485-492

[3]

BHARTIA, 1984, MILLIMETER WAVE ENG, P276

[4]

COLLIN RE, 1992, FDN MICROWAVE ENG, P153

[5]

COLLIN RE, 1991, FIELD THEORY GUIDED, P258

[6]

*DU PONT CO, PYRAL LX DAT SHEET

[7]

FINLAY HJ, 1986, IEEE MTT S INT MICR, P267

[8] LOSSES IN GAAS MICROSTRIP [J].

GOLDFARB, ME ;

PLATZKER, A .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1990, 38 (12) :1957-1963

[9]

Hammerstad E., 1975, 5th European Microwave Conference, P268

[10]

Hammerstad E., 1980, MICR S 1980 IEEE MTT, P407

← 1 2 3 →