Material contrast by combined scanning tunneling and force microscopy imaging of single-walled carbon nanotubes

被引：4

作者：

Clauss, W ^{[1
]}

Freitag, M ^{[1
]}

Bergeron, DJ ^{[1
]}

Johnson, AT ^{[1
]}

机构：

[1] Univ Penn, Dept Phys & Astron, Philadelphia, PA 19104 USA

来源：

CARBON | 2000年 / 38卷 / 11-12期

关键词：

carbon nanotubes; atomic force microscopy (AFM); scanning tunneling microscopy (STM);

D O I：

10.1016/S0008-6223(99)00297-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

A newly developed combination of tunneling and force microscopy enables near-atomic point resolution, and tubes can be identified without the need of a conducting substrate. This is a crucial step for the characterization of electronic devices based on individual single-wall tubes. Images of the spatial current distribution taken in constant force mode show strongly enhanced contrast between tubes and gold or silicon dioxide substrates, respectively, which is attributed to the unusual elastic properties of the nanotubes. (C) 2000 Elsevier Science Ltd. All rights reserved.

引用

页码：1735 / 1739

页数：5

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