Conduction development in electrically conductive adhesives with a bimodal size distributed conducting and inert particles: Effect of polydispersity

被引:7
作者
Mikrajuddin [1 ]
Shi, FG [1 ]
Okuyama, K [1 ]
Kim, HK [1 ]
机构
[1] Hiroshima Univ, Fac Engn, Higashihiroshima 7398527, Japan
来源
50TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE - 2000 PROCEEDINGS | 2000年
关键词
D O I
10.1109/ECTC.2000.853221
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A well known approach for reducing the electrical percolation threshold of an electrically conductive material is to mix the relatively small sized conducting fillers with the relatively large sized inert particles. The percolation limit in terms of the volume fraction of conducting particles is known to decrease with increasing ratio of the mean size between the small and large particles. However, both the small conducting and large inert particles rarely exist as monodispersed, rather, there is a respective size distribution for each of them. Such a size distribution is expected to affect the development of conductivity as well as the percolation threshold. The first theoretical model for considering such a size disperity effect on the conduction development and the percolation limit is reported. It is shown that the present model not only includes all the previous ones for considering only the particle size ratio effect, it considers the respective role played by the ratio of mean particle size, the size disperity and the volume fraction on the electrical conduction development and the percolation limit. The model suggests an innovative route for processing new conductive adhesives with ultralow percolation limits. Other implications for manufacturing electrically conductive adhesives are also discussed.
引用
收藏
页码:609 / 614
页数:4
相关论文
共 24 条
[1]   Molecular ribbons [J].
Datta, S ;
Janes, DB ;
Andres, RP ;
Kubiak, CP ;
Reifenberger, RG .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1998, 13 (12) :1347-1353
[2]   Conduction modelling of a conductive adhesive with bimodal distribution of conducting element [J].
Fu, Y ;
Liu, J ;
Willander, M .
INTERNATIONAL JOURNAL OF ADHESION AND ADHESIVES, 1999, 19 (04) :281-286
[3]   Size-controlled percolation pathways for electrical conduction in porous silicon [J].
Hamilton, B ;
Jacobs, J ;
Hill, DA ;
Pettifer, RF ;
Teehan, D ;
Canham, LT .
NATURE, 1998, 393 (6684) :443-445
[4]  
JANZEN J, 1980, J APPL PHYS, V51, P2279, DOI 10.1063/1.327860
[5]   Study of isotropically conductive bondings filled with aggregates of nano-sized Ag-particles [J].
Kotthaus, S ;
Gunther, BH ;
Haug, R ;
Schafer, H .
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART A, 1997, 20 (01) :15-20
[6]   Overview of conductive adhesive interconnection technologies for LCD's [J].
Kristiansen, H ;
Liu, J .
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART A, 1998, 21 (02) :208-214
[7]   INFLUENCE OF PARTICLE-SIZE RATIO ON CONTINUITY OF AGGREGATES [J].
KUSY, RP .
JOURNAL OF APPLIED PHYSICS, 1977, 48 (12) :5301-5305
[8]   Anisotropically conductive adhesive flip-chip bonding on rigid and flexible printed circuit substrates [J].
Lai, ZH ;
Liu, JH .
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART B-ADVANCED PACKAGING, 1996, 19 (03) :644-660
[9]   Electrical conduction models for isotropically conductive adhesive joints [J].
Li, L ;
Morris, JE .
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART A, 1997, 20 (01) :3-8
[10]  
Li Li, 1998, International Journal of Microelectronic Packaging, Materials and Technologies, V1, P159