Optimizing the NIST magnetic imaging reference sample

被引:6
作者
Rice, P
Russek, SE
Hoinville, J
Kelley, MH
机构
[1] MAXTOR CORP,LONGMONT,CO 80501
[2] NIST,GAITHERSBURG,MD 20899
关键词
D O I
10.1109/20.619664
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have further developed the NIST magnetic imaging reference sample to include a magnetic pattern which can indicate the magnetic polarity of a magnetic force microscope tip. Several samples cut from the same disk were measured with a single tip. We have also measured a single transition with several tips. Both measurements have shown the variability in images taken with different tips and different instrument configuration which underscores the need for a well calibrated sample.
引用
收藏
页码:4065 / 4067
页数:3
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