Research on edge identification of a defect using pulsed eddy current based on principal component analysis

被引:29
作者
Yang BinFeng [1 ]
Luo FeiLu [1 ]
Han Dan [1 ]
机构
[1] Natl Univ Def Technol, Coll Mechantron Engn & Automat, Changsha 410073, Peoples R China
关键词
arrays of pulsed eddy current sensors; principal component analysis; edge identification; defect;
D O I
10.1016/j.ndteint.2006.12.005
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
It is difficult to identify the edge of a defect in nondestructive testing (NDT), which affects the result of a C-scan image acquired by arrays of pulsed eddy current sensors (APECS). To overcome the problem of low accuracy in identification of the edge of a defect using the conventional eddy current techniques, which only extract features in time domain, features from pulsed eddy current that has a broadband frequency are extracted both in time and frequency domains. A method based on principal component analysis (PCA) is proposed to enhance the accuracy in identification of the edge of a defect, the agreement between theory and experiment shows that the proposed method is applicable and preferable to APECS. (c) 2007 Elsevier Ltd. All rights reserved.
引用
收藏
页码:294 / 299
页数:6
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