Magnetic domain imaging with a photoemission microscope

被引：14

作者：

Schneider, CM ^{[1
]}

Fromter, R ^{[1
]}

Ziethen, C ^{[1
]}

Swiech, W ^{[1
]}

Brookes, NB ^{[1
]}

Schonhense, G ^{[1
]}

Kirschner, J ^{[1
]}

机构：

[1] Univ Mainz, Inst Phys, D-55099 Mainz, Germany

来源：

MAGNETIC ULTRATHIN FILMS, MULTILAYERS AND SURFACES - 1997 | 1997年 / 475卷

关键词：

D O I：

10.1557/PROC-475-381

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Photoelectron emission microscopy (PEEM) has proven to be a versatile analytical technique in surface science. When operated with circularly polarized light in the soft x-ray regime, however, photoemission microscopy offers a unique combination of magnetic and chemical information. Exploiting the high brilliance and circular polarization available at a helical undulator beamline, the lateral resolution in the imaging of magnetic domain structures may be pushed well into the sub-micrometer range, Using a newly designed photoemission microscope we show that under these circumstances not only domains, but also domain walls can be selectively investigated. The high sensitivity of the technique yields a sizable magnetic contrast even from magnetic films as thin as a fraction of a single monolayer. The combination of chemical selectivity and information depth is successfully employed to investigate the magnetic behavior of buried layers and covered surfaces. This approach offers a convenient access to magnetic coup ling phenomena in magnetic sandwiches.

引用

页码：381 / 392

页数：12