Spectral interferograms including the equalization wavelengths processed by autoconvolution method

被引:12
作者
Hlubina, P [1 ]
Gurov, I [1 ]
机构
[1] Silesian Univ Opava, Inst Phys, Opava 74601, Czech Republic
来源
LIGHTMETRY 2002: METROLOGY AND TESTING TECHNIQUES USING LIGHT | 2003年 / 5064卷
关键词
white-light source; spectral interference; Michelson interferometer; fused-silica sample; equalization wavelength; thickness; refractive index; phase function; optical path difference;
D O I
10.1117/12.501517
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The processing of the recorded spectral interferograms including the equalization wavelengths is extended by using autoconvolution method to determine the equalization wavelengths precisely. The equalization wavelength determination is used to estimate the spectral fringe phase function in a two-beam interference experiment with the compensated Michelson interferometer and an optical sample inserted in it under the knowledge of both dispersion in the interferometer and the displacement of the interferometer mirror. The interferometer dispersion is given by the thickness of fused-silica optical sample and its refractive index, which can be evaluated from the Sellmeier dispersion relation. Good agreement between the recorded and theoretical spectral interferograms is confirmed and a new method of determining the optical path differences between beams of the interferometer is proposed.
引用
收藏
页码:198 / 205
页数:8
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