Pattern recognition for statistical process control charts

被引:17
作者
Wang, JM [1 ]
Kochhar, AK [1 ]
Hannam, RG [1 ]
机构
[1] UMIST, Dept Mech Engn MD, Mfg Div, Manchester M60 1QD, Lancs, England
关键词
control charts; pattern recognition; patterns; statistical process control;
D O I
10.1007/BF01322218
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Control charts are important statistical process control tools for determining whether a process is run in its intended mode or in the presence of unnatural patterns. Patterns displayed on control charts can provide information about the process. This paper describes the development of a pattern recognition system designed to detect and analyse various patterns that can occur on statistical quality control charts. The system looks not only for simple patterns, such as trend shift and stratification, but also for superimposed patterns, such as trend + shift. The effect of noise associated with individual patterns is also analysed. The benefits of the approach compared with the alternatives are discussed.
引用
收藏
页码:99 / 109
页数:11
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