Imaging soft samples in liquid with tuning fork based shear force microscopy

被引:60
作者
Rensen, WHJ
van Hulst, NF
Kämmer, SB
机构
[1] Univ Twente, Appl Opt Grp, NL-7500 AE Enschede, Netherlands
[2] ThermoMicroscopes, Sunnyvale, CA 94089 USA
关键词
D O I
10.1063/1.1308058
中图分类号
O59 [应用物理学];
学科分类号
摘要
We present a study of the dynamic behavior of tuning forks and the application of tuning fork based shear force microscopy on soft samples in liquid. A shift in resonance frequency and a recovery of the tip vibration amplitude have been observed upon immersion into liquid. Conservation of the vibration mode is confirmed by both direct stroboscopic observation and by detection of the tip vibration amplitude of the tuning fork. Thanks to the partial recovery of the Q factor upon complete immersion into liquid, it is possible to obtain high-resolution images on soft samples in liquid. This opens a new domain of applications for tuning fork based near-field scanning optical microscopes. (C) 2000 American Institute of Physics. [S0003-6951(00)04436-3].
引用
收藏
页码:1557 / 1559
页数:3
相关论文
共 8 条
[1]   Distance control in near-field optical microscopy with piezoelectrical shear-force detection suitable for imaging in liquids [J].
Brunner, R ;
Bietsch, A ;
Hollricher, O ;
Marti, O .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1997, 68 (04) :1769-1772
[2]   Scanning electrochemical microscopy with simultaneous independent topography [J].
James, PI ;
Garfias-Mesias, LF ;
Moyer, PJ ;
Smyrl, WH .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1998, 145 (04) :L64-L66
[3]   PIEZOELECTRIC TIP-SAMPLE DISTANCE CONTROL FOR NEAR-FIELD OPTICAL MICROSCOPES [J].
KARRAI, K ;
GROBER, RD .
APPLIED PHYSICS LETTERS, 1995, 66 (14) :1842-1844
[4]   Reduction of tip-sample interaction forces for scanning near-field optical microscopy in a liquid environment [J].
Lambelet, P ;
Pfeffer, M ;
Sayah, A ;
Marquis-Weible, F .
ULTRAMICROSCOPY, 1998, 71 (1-4) :117-121
[5]  
Moyer PJ, 1996, APPL PHYS LETT, V68, P3380, DOI 10.1063/1.116510
[6]   Atomic steps with tuning-fork-based noncontact atomic force microscopy [J].
Rensen, WHJ ;
van Hulst, NF ;
Ruiter, AGT ;
West, PE .
APPLIED PHYSICS LETTERS, 1999, 75 (11) :1640-1642
[7]   Tuning fork shear-force feedback [J].
Ruiter, AGT ;
van der Werf, KO ;
Veerman, JA ;
Garcia-Parajo, MF ;
Rensen, WHJ ;
van Hulst, NF .
ULTRAMICROSCOPY, 1998, 71 (1-4) :149-157
[8]   Single molecule detection and underwater fluorescence imaging with cantilevered near-field fiber optic probes [J].
Talley, CE ;
Lee, MA ;
Dunn, RC .
APPLIED PHYSICS LETTERS, 1998, 72 (23) :2954-2956