Exact Bragg backscattering of x rays

被引：39

作者：

Shvyd'ko, YV ^{[1
]}

Gerdau, E ^{[1
]}

Jaschke, J ^{[1
]}

Leupold, O ^{[1
]}

Lucht, M ^{[1
]}

Ruter, HD ^{[1
]}

机构：

[1] Univ Hamburg, Inst Expt Phys 2, D-22761 Hamburg, Germany

来源：

PHYSICAL REVIEW B | 1998年 / 57卷 / 09期

关键词：

D O I：

10.1103/PhysRevB.57.4968

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Exact 180 degrees Bragg scattering of pulsed synchrotron radiation was observed by using a semitransparent detector and a time-of-flight technique. The angular dependences of Bragg scattering of monochromatic 14.413 keV x rays with only 0.5 mu eV bandwidth were studied by utilizing the (1 3 (4) over bar 28) reflection of an Al2O3 crystal at different temperatures. By heating the crystal first the exact backscattering shows up achieving maximum intensity and 1.7 mrad angular width at 372.40 K. By increasing the temperature it develops into the usual Bragg reflection with much narrower angular profile. The measured dependences are in agreement with the theory. The fit is sensitive to a 5x10(-9) Angstrom variation of interplanar distance.

引用

页码：4968 / 4971

页数：4

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