Scattering at sidewall roughness in photonic crystal slabs

被引：64

作者：

Bogaerts, W ^{[1
]}

Bienstman, P ^{[1
]}

Baets, R ^{[1
]}

机构：

[1] State Univ Ghent, Interuniv Microelect Ctr, Dept Informat Technol, B-9000 Ghent, Belgium

来源：

OPTICS LETTERS | 2003年 / 28卷 / 09期

关键词：

D O I：

10.1364/OL.28.000689

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We have simulated the effect of sidewall roughness in photonic-crystallite structures with different vertical refractive-index contrast. We treated the scattering off a sidewall irregularity as a radiating dipole excited by the incident waveguide mode. We show that the loss that is due to this scattering is significantly larger for structures with a low refractive-index contrast (such as GaAs/AlGaAs Waveguides) than for structures with a high vertical index contrast (such as silicon-on-insulators and membranes). (C) 2003 Optical Society of America.

引用

页码：689 / 691

页数：3

共 10 条

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