Study on surface magnetic domain structure of thin-gauged 3%Si-Fe strips using scanning electron microscope with polarization analyzer

被引:1
作者
Lee, Y
Koymen, AR
Heo, NH
Na, JG
Woo, JS
机构
[1] Univ Texas, Dept Phys, Arlington, TX 76019 USA
[2] KEPRE, Mat & Corros Lab, Taejon, South Korea
[3] KIST, Div Met, Seoul, South Korea
[4] Pohang Iron & Steel Co, Res Labs, Pohang, Kyungbuk, South Korea
关键词
D O I
10.1016/S1359-6462(98)00061-X
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
[No abstract available]
引用
收藏
页码:1365 / 1369
页数:5
相关论文
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