Nano-optical Investigations of the Metal-Insulator Phase Behavior of Individual VO2 Microcrystals

被引:232
作者
Jones, Andrew C. [1 ,2 ]
Berweger, Samuel [2 ]
Wei, Jiang [1 ]
Cobden, David [1 ]
Raschke, Markus B. [1 ,2 ]
机构
[1] Univ Washington, Dept Phys, Seattle, WA 98195 USA
[2] Univ Washington, Dept Chem, Seattle, WA 98195 USA
基金
美国国家科学基金会;
关键词
Vanadium dioxide; metal-to-insulator transition; near-field microscopy; Raman spectroscopy; VANADIUM DIOXIDE; MOTT-HUBBARD; TRANSITION; PEIERLS; VIEW; MICROSCOPY; OXIDES;
D O I
10.1021/nl903765h
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Despite the relatively simple stoichiometry and structure of VO2, many questions regarding the nature of its famous metal insulator transition (MIT) remain unresolved, This is in part due to the prevailing use of polycrystalline film samples and the limited spatial resolution in most studies, hindering access to and control of the complex phase behavior and its inevitable spatial inhomogeneities. Here, we investigate the MIT and associated nanodomain formation in individual VO2 microcrystals subject to substrate stress. We employ symmetry-selective polarization Raman spectroscopy to identify crystals that are strain-stabilized in either the monoclinic M1 or M2 insulating phase at room-temperature. Raman measurements are further used to characterize the phase dependence on temperature, identifying the appearance of the M2 phase during the MIT. The associated formation and spatial evolution of rutile (R) metallic domains is studied with nanometer-scale spatial resolution using infrared scattering-scanning near-held optical microscopy (s-SNOM). We deduce that even for small crystals of VO2, the MIT is influenced by the competition between the R, M1, and M2 crystal phases with their different lattice constants subjected to the external substrate-induced stress. The results have important implications for the interpretation of the investigations of conventional polycrystalline thin Films where the mutual interaction of constituent crystallites may affect the nature of the MIT in VO2.
引用
收藏
页码:1574 / 1581
页数:8
相关论文
共 47 条
[1]   INFRARED OPTICAL PROPERTIES OF VANADIUM DIOXIDE ABOVE AND BELOW TRANSITION TEMPERATURE [J].
BARKER, AS ;
VERLEUR, HW ;
GUGGENHEIM, HJ .
PHYSICAL REVIEW LETTERS, 1966, 17 (26) :1286-+
[2]   Signal limitations in tip-enhanced Raman scattering: the challenge to become a routine analytical technique [J].
Berweger, Samuel ;
Raschke, Markus B. .
ANALYTICAL AND BIOANALYTICAL CHEMISTRY, 2010, 396 (01) :115-123
[3]  
Cao J., 2009, NAT NANOTECHNOL
[4]  
Cao J., UNPUB
[5]   Ultra-broadband femtosecond measurements of the photo-induced phase transition in VO2:: From the mid-IR to the hard x-rays [J].
Cavalleri, A ;
Rini, M ;
Schoenlein, RW .
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 2006, 75 (01)
[6]   OPTICAL-PROPERTIES OF VANADIUM DIOXIDE AND VANADIUM PENTOXIDE THIN-FILMS [J].
CHAIN, EE .
APPLIED OPTICS, 1991, 30 (19) :2782-2787
[7]  
Chamberland B. L., 1973, Journal of Solid State Chemistry, V7, P377, DOI 10.1016/0022-4596(73)90166-7
[8]   Phase coexistence in the metal-insulator transition of a VO2 thin film [J].
Chang, YJ ;
Koo, CH ;
Yang, JS ;
Kim, YS ;
Kim, DH ;
Lee, JS ;
Noh, TW ;
Kim, HT ;
Chae, BG .
THIN SOLID FILMS, 2005, 486 (1-2) :46-49
[9]   Mid-infrared properties of a VO2 film near the metal-insulator transition [J].
Choi, HS ;
Ahn, JS ;
Jung, JH ;
Noh, TW ;
Kim, DH .
PHYSICAL REVIEW B, 1996, 54 (07) :4621-4628
[10]   Vanadium oxide nanowire phase and orientation analyzed by Raman spectroscopy [J].
Chou, J. Y. ;
Lensch-Falk, J. L. ;
Hemesath, E. R. ;
Lauhon, L. J. .
JOURNAL OF APPLIED PHYSICS, 2009, 105 (03)