Enhanced GMR in [NiFe/Cu/Co] with specular reflective capping layers

被引:9
作者
Sakakima, H [1 ]
Hirota, E [1 ]
Kawawake, Y [1 ]
机构
[1] Matsushita Elect Ind Co Ltd, Cent Res Lab, Kyoto 61902, Japan
关键词
magnetoresistance; -; giant; specular scattering; simulation; multilayers; capping layer;
D O I
10.1016/S0304-8853(97)01112-8
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Enhancement of MR ratio with addition of Cu/Ag capping layers was found in NiFe/Cu/Co GMR films prepared on MgO substrates with Pt/Cu buffer layers. Simulation of the MR ratio was carried out using the theoretical model given by J. Barnas, A. Fuss, R.E. Camley, P. Grunberg; W. Zinn [Phys. Rev. B 42 (1990) 8110] to clarify the origin of the enhancement of GMR. The results show that the specular scattering plays an important role in the films and the enhanced GMR can be explained by assuming the increase of specularity factor of the capping layer. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:49 / 54
页数:6
相关论文
共 7 条
  • [1] NOVEL MAGNETORESISTANCE EFFECT IN LAYERED MAGNETIC-STRUCTURES - THEORY AND EXPERIMENT
    BARNAS, J
    FUSS, A
    CAMLEY, RE
    GRUNBERG, P
    ZINN, W
    [J]. PHYSICAL REVIEW B, 1990, 42 (13): : 8110 - 8120
  • [2] EGELHOFF WF, INTERMAG 97 NEW ORL
  • [3] DIRECT MEASUREMENT OF SPIN-DEPENDENT CONDUCTION-ELECTRON MEAN FREE PATHS IN FERROMAGNETIC METALS
    GURNEY, BA
    SPERIOSU, VS
    NOZIERES, JP
    LEFAKIS, H
    WILHOIT, DR
    NEED, OU
    [J]. PHYSICAL REVIEW LETTERS, 1993, 71 (24) : 4023 - 4026
  • [4] KAWAWAKE Y, INTERMAG 97 NEW ORL
  • [5] ELECTRICAL RESISTIVITY OF THIN EPITAXIALLY GROWN SILVER FILMS ( RESISTIVITY RATIOS 17 TO 175 WITH FILM THICKNESS 640 TO 13000 A E/T )
    LARSON, DC
    BOIKO, BT
    [J]. APPLIED PHYSICS LETTERS, 1964, 5 (08) : 155 - &
  • [6] THE MEAN FREE PATH OF ELECTRONS IN METALS
    SONDHEIMER, EH
    [J]. ADVANCES IN PHYSICS, 1952, 1 (01) : 1 - 42
  • [7] Enhanced giant magnetoresistance in spin-valves sandwiched between insulating NiO
    Swagten, HJM
    Strijkers, GJ
    Bloemen, PJH
    Willekens, MMH
    deJonge, WJM
    [J]. PHYSICAL REVIEW B, 1996, 53 (14): : 9108 - 9114