Scanning tunneling microscopy and spectroscopy of topological defects in carbon nanotubes

被引：40

作者：

Meunier, V ^{[1
]}

Lambin, P ^{[1
]}

机构：

[1] Fac Univ Notre Dame Paix, Lab Phys Solide, B-5000 Namur, Belgium

来源：

CARBON | 2000年 / 38卷 / 11-12期

关键词：

carbon nanotubes; scanning tunneling microscopy (STM);

D O I：

10.1016/S0008-6223(99)00296-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Scanning tunneling microscopy (STM) and scanning tunneling spectroscopy (STS) are powerful techniques for investigating the electronic and topographic properties of carbon nanotubes. The growing availability of STM data allows the accurate study of perfect tubules. Today, the identification of topological and non-topological modifications of the hexagonal lattice of a carbon nanotube is experimentally challenging. Our recently proposed approach to interpret and predict STM and STS observations on a routine basis is used to simulate the topographic and spectroscopic signatures of pentagons and heptagons and contribute to their identification. (C) 2000 Elsevier Science Ltd. All rights reserved.

引用

页码：1729 / 1733

页数：5

共 30 条

[1] Scanning tunnelling microscopy (STM) imaging of carbon nanotubes [J].

Biro, LP ;

Gyulai, J ;

Lambin, P ;

Nagy, JB ;

Lazarescu, S ;

Mark, GI ;

Fonseca, A ;

Surjan, PR ;

Szekeres, Z ;

Thiry, PA ;

Lucas, AA .

CARBON, 1998, 36 (5-6) :689-696

[2] Scanning tunneling microscope investigation of carbon nanotubes produced by catalytic decomposition of acetylene [J].

Biro, LP ;

Lazarescu, S ;

Lambin, P ;

Thiry, PA ;

Fonseca, A ;

Nagy, JB ;

Lucas, AA .

PHYSICAL REVIEW B, 1997, 56 (19) :12490-12498

[3] Electronic structure and localized states at carbon nanotube tips [J].

Carroll, DL ;

Redlich, P ;

Ajayan, PM ;

Charlier, JC ;

Blase, X ;

DeVita, A ;

Car, R .

PHYSICAL REVIEW LETTERS, 1997, 78 (14) :2811-2814

[4] Atomic resolution STM imaging of a twisted single-wall carbon nanotube [J].

Clauss, W ;

Bergeron, DJ ;

Johnson, AT .

PHYSICAL REVIEW B, 1998, 58 (08) :R4266-R4269

[5] CHARACTERIZATION OF CARBON NANOTUBES BY SCANNING PROBE MICROSCOPY [J].

GALLAGHER, MJ ;

CHEN, D ;

JACOBSEN, BP ;

SARID, D ;

LAMB, LD ;

TINKER, FA ;

JIAO, J ;

HUFFMAN, DR ;

SERAPHIN, S ;

ZHOU, D .

SURFACE SCIENCE, 1993, 281 (03) :L335-L340

[6] SCANNING-TUNNELING-MICROSCOPY OF SINGLE-SHELL NANOTUBES OF CARBON [J].

GE, MH ;

SATTLER, K .

APPLIED PHYSICS LETTERS, 1994, 65 (18) :2284-2286

[7] VAPOR-CONDENSATION GENERATION AND STM ANALYSIS OF FULLERENE TUBES [J].

GE, MH ;

SATTLER, K .

SCIENCE, 1993, 260 (5107) :515-518

[8] Atomic structure and electronic properties of single-wall carbon nanotubes probed by scanning tunneling microscope at room temperature [J].

Hassanien, A ;

Tokumoto, M ;

Kumazawa, Y ;

Kataura, H ;

Maniwa, Y ;

Suzuki, S ;

Achiba, Y .

APPLIED PHYSICS LETTERS, 1998, 73 (26) :3839-3841

[9] Scanning probe microscopy of carbon nanotubes [J].

Hubler, U ;

Jess, P ;

Lang, HP ;

Guntherodt, HJ ;

Salvetat, JP ;

Forro, L .

CARBON, 1998, 36 (5-6) :697-700

[10] GROWTH-MODEL FOR CARBON NANOTUBES [J].

IIJIMA, S ;

AJAYAN, PM ;

ICHIHASHI, T .

PHYSICAL REVIEW LETTERS, 1992, 69 (21) :3100-3103

← 1 2 3 →